JR

Jean-Pierre Rey

TI Tencor Instruments: 1 patents #25 of 50Top 50%
📍 Fontenay-aux-Roses, FR: #55 of 220 inventorsTop 25%
Overall (All Time): #2,158,424 of 4,157,543Top 55%
2
Patents All Time

Issued Patents All Time

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
7230701 Compact spectroscopic ellipsometer Jean-Louis Stehle, Jean-Philippe Piel, Pierre Boher, Luc Tantart 2007-06-12
5608526 Focused beam spectroscopic ellipsometry method and system Timothy R. Piwonka-Corle, Karen Scoffone, Xing Chen, Lloyd J. LaComb, JR., Jean-Louis Stehle +1 more 1997-03-04