Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6734967 | Focused beam spectroscopic ellipsometry method and system | Timothy R. Piwonka-Corle, Xing Chen, Lloyd J. LaComb, JR., Jean-Louis Stehle, Dorian Zahorski +1 more | 2004-05-11 |
| 5608526 | Focused beam spectroscopic ellipsometry method and system | Timothy R. Piwonka-Corle, Xing Chen, Lloyd J. LaComb, JR., Jean-Louis Stehle, Dorian Zahorski +1 more | 1997-03-04 |