TP

Timothy R. Piwonka-Corle

MI Mks Instruments: 4 patents #87 of 442Top 20%
Tektronix: 3 patents #378 of 1,698Top 25%
KL Kla-Tencor: 2 patents #809 of 1,394Top 60%
KA Karcher North America: 1 patents #30 of 62Top 50%
TI Tencor Instruments: 1 patents #25 of 50Top 50%
📍 Boulder, CO: #647 of 5,018 inventorsTop 15%
🗺 Colorado: #4,179 of 40,980 inventorsTop 15%
Overall (All Time): #451,053 of 4,157,543Top 15%
11
Patents All Time

Issued Patents All Time

Showing 1–11 of 11 patents

Patent #TitleCo-InventorsDate
11366036 Polymer composite vacuum components Brandon J. Kelly, Clinton L. Percy, Scott C. Heinbuch, Gerardo A. Brucker, Timothy C. Swinney 2022-06-21
10876917 Polymer composite vacuum components Brandon J. Kelly, Clinton L. Percy, Scott C. Heinbuch, Gerardo A. Brucker, Timothy C. Swinney 2020-12-29
10814358 Floor cleaning device with disinfection capabilities Garrett Geer, Rylee Schauer 2020-10-27
10359332 Polymer composite vacuum components Brandon J. Kelly, Clinton L. Percy, Scott C. Heinbuch, Gerardo A. Brucker, Timothy C. Swinney 2019-07-23
9040907 Method and apparatus for tuning an electrostatic ion trap Gerardo A. Brucker, G. Jeffery Rathbone, Brian J. Horvath, Timothy C. Swinney, Stephen C. Blouch +1 more 2015-05-26
7424177 Variable attenuation signal acquisition probing and voltage measurement systems using an electro-optical cavity Christopher P. Yakymyshyn, William Q. Law, William A. Hagerup 2008-09-09
7310455 Variable attenuation signal acquisition probing and voltage measurement systems using an electro-optical cavity Christopher P. Yakymyshyn, William Q. Law, William A. Hagerup 2007-12-18
7221813 Signal acquisition probing and voltage measurement systems using an electro-optical cavity Christopher P. Yakymyshyn, William Q. Law, William A. Hagerup 2007-05-22
6734967 Focused beam spectroscopic ellipsometry method and system Karen Scoffone, Xing Chen, Lloyd J. LaComb, JR., Jean-Louis Stehle, Dorian Zahorski +1 more 2004-05-11
5910842 Focused beam spectroscopic ellipsometry method and system Xing Chen, Lloyd J. LaComb, JR., Jean-Louis Stehle, Dorian Zahorski 1999-06-08
5608526 Focused beam spectroscopic ellipsometry method and system Karen Scoffone, Xing Chen, Lloyd J. LaComb, JR., Jean-Louis Stehle, Dorian Zahorski +1 more 1997-03-04