Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6734967 | Focused beam spectroscopic ellipsometry method and system | Timothy R. Piwonka-Corle, Karen Scoffone, Xing Chen, Lloyd J. LaComb, JR., Jean-Louis Stehle +1 more | 2004-05-11 |
| 5991037 | High spatial resolution ellipsometry device | Jean-Philippe Piel, Jean-Louis Stehle | 1999-11-23 |
| 5910842 | Focused beam spectroscopic ellipsometry method and system | Timothy R. Piwonka-Corle, Xing Chen, Lloyd J. LaComb, JR., Jean-Louis Stehle | 1999-06-08 |
| 5608526 | Focused beam spectroscopic ellipsometry method and system | Timothy R. Piwonka-Corle, Karen Scoffone, Xing Chen, Lloyd J. LaComb, JR., Jean-Louis Stehle +1 more | 1997-03-04 |