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Apparatus and method for aligning an optical fiber with an optical device |
Renyi Yang, Thomas B. Reynolds, Aaron Hawkins |
2003-10-14 |
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Single-etch stop process for the manufacture of silicon-on-insulator wafers |
Subramanian S. Iyer, Emil Baran, Mark Mastroianni |
1999-08-10 |
| 5834812 |
Edge stripped BESOI wafer |
David Golland, Ronald D. Bartram |
1998-11-10 |
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Process for stripping outer edge of BESOI wafers |
David Golland, Ronald D. Bartram |
1997-09-16 |
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Single-etch stop process for the manufacture of silicon-on-insulator substrates |
Subramanian S. Iyer, Emil Baran, Mark Mastroianni |
1996-02-27 |
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Method for detecting sources of contamination in silicon using a contamination monitor wafer |
Robert J. Falster, Gabriella Borionetti |
1995-05-23 |
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Ultra pure water system monitoring |
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1988-11-29 |