MI

Masashi Ichikawa

SC Shin-Etsu Handotai Co.: 5 patents #149 of 679Top 25%
KT Kabushiki Kaisha Toshiba: 3 patents #8,011 of 21,451Top 40%
NI Nikon: 3 patents #1,048 of 2,493Top 45%
NS Nippon Steel: 3 patents #914 of 4,423Top 25%
NE Nec: 2 patents #5,510 of 14,502Top 40%
Sharp Kabushiki Kaisha: 1 patents #6,861 of 10,731Top 65%
Overall (All Time): #456,443 of 4,157,543Top 15%
11
Patents All Time

Issued Patents All Time

Showing 1–11 of 11 patents

Patent #TitleCo-InventorsDate
10812665 Information transmitting apparatus, multifunctional peripheral, information transmitting method, and non-transitory recording medium Yuichi Nishii, Miyoko Maruyama 2020-10-20
7474386 Wafer flatness evaluation method, wafer flatness evaluation apparatus carrying out the evaluation method, wafer manufacturing method using the evaluation method, wafer quality assurance method using the evaluation method, semiconductor device manufacturing method using the evaluation method and semiconductor device manufacturing method using a wafer evaluated by the evaluation method Tadahito Fujisawa, Soichi Inoue, Makoto Kobayashi, Tsuneyuki Hagiwara, Kenichi Kodama 2009-01-06
7365830 Wafer flatness evaluation method, wafer flatness evaluation apparatus carrying out the evaluation method, wafer manufacturing method using the evaluation method, wafer quality assurance method using the evaluation method, semiconductor device manufacturing method using the evaluation method and semiconductor device manufacturing method using a wafer evaluated by the evaluation method Tadahito Fujisawa, Soichi Inoue, Makoto Kobayashi, Tsuneyuki Hagiwara, Kenichi Kodama 2008-04-29
7276427 Method for manufacturing SOI wafer Takeshi Kobayashi, Miho Iwabuchi 2007-10-02
7230680 Wafer flatness evaluation method, wafer flatness evaluation apparatus carrying out the evaluation method, wafer manufacturing method using the evaluation method, wafer quality assurance method using the evaluation method, semiconductor device manufacturing method using the evaluation method and semiconductor device manufacturing method using a wafer evaluated by the evaluation method Tadahito Fujisawa, Soichi Inoue, Makoto Kobayashi, Tsuneyuki Hagiwara, Kenichi Kodama 2007-06-12
7203559 Method for manufacturing semiconductor wafer, method for receiving order for manufacture of semiconductor wafer, and system for receiving order for manufacture of semiconductor wafer Tatsuo Ito, Shigeyoshi Netsu, Nobuhiro Ohara 2007-04-10
6294228 Method for forming thin films 2001-09-25
6048792 Method for manufacturing an interconnection structure in a semiconductor device Kenji Watanabe 2000-04-11
5047608 Method and apparatus for resistance welding wherein the electrode axis is included with respect to the electrode forcing axis Yasuo Takahashi, Tohru Saito, Tadayuki Otani, Kunihiro Hayashida 1991-09-10
4561561 Container having an easy opening end with a tab affixed by ultrasonic welding Yasuo Takahashi, Tohru Saito 1985-12-31
4506134 Flash butt welding method Toru Saito, Takeshi Nishi 1985-03-19