| 10776277 |
Partial memory die with inter-plane re-mapping |
Daniel Linnen, Srikar Peesari, Kirubakaran Periyannan, Avinash Rajagiri, Shantanu Gupta +2 more |
2020-09-15 |
| 10564861 |
Parity relocation for reducing temperature throttling |
Daniel Linnen, Dongxiang Liao, Avinash Rajagiri, Ashish Ghai, Abhinav Anand |
2020-02-18 |
| 10290354 |
Partial memory die |
Daniel Linnen, Srikar Peesari, Kirubakaran Periyannan, Avinash Rajagiri, Shantanu Gupta +4 more |
2019-05-14 |
| 10242750 |
High-speed data path testing techniques for non-volatile memory |
Daniel Linnen, Srikar Peesari, Kirubakaran Periyannan, Shantanu Gupta, Avinash Rajagiri +2 more |
2019-03-26 |
| 10032524 |
Techniques for determining local interconnect defects |
Sagar Magia, Jayavel Pachamuthu |
2018-07-24 |
| 9953717 |
NAND structure with tier select gate transistors |
Jayavel Pachamuthu, Peter Rabkin |
2018-04-24 |
| 9934872 |
Erase stress and delta erase loop count methods for various fail modes in non-volatile memory |
Sagar Magia, Jayavel Pachamuthu |
2018-04-03 |
| 9881929 |
Multi-tier memory stack structure containing non-overlapping support pillar structures and method of making thereof |
Pradhyumna Ravikirthi, Jayavel Pachamuthu, Peter Rabkin |
2018-01-30 |
| 9830998 |
Stress patterns to detect shorts in three dimensional non-volatile memory |
Jayavel Pachamuthu, Sagar Magia, Ankitkumar Babariya |
2017-11-28 |
| 9653175 |
Determination of word line to word line shorts between adjacent blocks |
Sagar Magia, Khanh Nguyen |
2017-05-16 |
| 9564219 |
Current based detection and recording of memory hole-interconnect spacing defects |
Sagar Magia, Jayavel Pachamuthu, Ankitkumar Babariya |
2017-02-07 |
| 9548129 |
Word line look ahead read for word line to word line short detection |
Rajan Paudel, Mrinal Kochar, Sagar Magia |
2017-01-17 |
| 9530514 |
Select gate defect detection |
Jayavel Pachamuthu, Sagar Magia |
2016-12-27 |
| 9514835 |
Determination of word line to word line shorts between adjacent blocks |
Sagar Magia, Khanh Nguyen |
2016-12-06 |
| 9496040 |
Adaptive multi-page programming methods and apparatus for non-volatile memory |
Rajan Paudel, Sagar Magia |
2016-11-15 |
| 9484086 |
Determination of word line to local source line shorts |
Sagar Magia |
2016-11-01 |
| 9460809 |
AC stress mode to screen out word line to word line shorts |
Sagar Magia |
2016-10-04 |
| 9449698 |
Block and zone erase algorithm for memory |
Rajan Paudel, Sagar Magia |
2016-09-20 |
| 9449694 |
Non-volatile memory with multi-word line select for defect detection operations |
Rajan Paudel, Sagar Magia, Khanh Nguyen |
2016-09-20 |
| 9269446 |
Methods to improve programming of slow cells |
Sagar Magia, Jayavel Pachamuthu, Ankitkumar Babariya |
2016-02-23 |
| 9240249 |
AC stress methods to screen out bit line defects |
Sagar Magia, Jayavel Pachamuthu |
2016-01-19 |
| 9224502 |
Techniques for detection and treating memory hole to local interconnect marginality defects |
Sagar Magia, Jayavel Pachamuthu, Deepak Raghu |
2015-12-29 |
| 9202593 |
Techniques for detecting broken word lines in non-volatile memories |
Sagar Magia, Tien-Chien Kuo, Jayavel Pachamuthu |
2015-12-01 |