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Multiple plane programming with quick plane programming termination and lagging plane boosting |
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| 11947890 |
Implementation of deep neural networks for testing and quality control in the production of memory devices |
Cheng-Chung Chu, Janet George, Daniel Linnen |
2024-04-02 |
| 11023327 |
Encryption detection and backup management |
Daniel Linnen, Avinash Rajagiri, Srikar Peesari |
2021-06-01 |
| 11003551 |
Non-volatile storage system with program failure recovery |
Daniel Linnen, Khanfer A. Kukkady |
2021-05-11 |
| 10886002 |
NAND field use erase plus defect detections |
Daniel Linnen, Avinash Rajagiri, Yuvaraj Krishnamoorthy, Srikar Peesari, Dongxiang Liao |
2021-01-05 |
| 10846418 |
Location-based authentication and monitoring for data storage devices |
Daniel Linnen, Avinash Rajagiri, Srikar Peesari, Dongxiang Liao, Rohit Sehgal |
2020-11-24 |
| 10776277 |
Partial memory die with inter-plane re-mapping |
Daniel Linnen, Srikar Peesari, Kirubakaran Periyannan, Avinash Rajagiri, Shantanu Gupta +2 more |
2020-09-15 |
| 10564861 |
Parity relocation for reducing temperature throttling |
Daniel Linnen, Dongxiang Liao, Jagdish Sabde, Avinash Rajagiri, Abhinav Anand |
2020-02-18 |
| 10324859 |
Multi-plane memory management |
Daniel Linnen, Dongxiang Liao, Srikar Peesari, Avinash Rajagiri, Philip Reusswig +1 more |
2019-06-18 |
| 10290354 |
Partial memory die |
Daniel Linnen, Srikar Peesari, Kirubakaran Periyannan, Avinash Rajagiri, Shantanu Gupta +4 more |
2019-05-14 |
| 10249382 |
Determination of fast to program word lines in non-volatile memory |
Dana Lee, Ekam Singh, Kalpana Vakati |
2019-04-02 |
| 9905307 |
Leakage current detection in 3D memory |
Lakshmi Kalpana Vakati, Ekamdeep Singh, Chang Hua Siau, Gopinath Balakrishnan, Kapil Verma |
2018-02-27 |
| 9711227 |
Non-volatile memory with in field failure prediction using leakage detection |
Yuvaraj Krishnamoorthy, Ekamdeep Singh, Kalpana Vakati, Maythin Uthayopas, Mark Shlick +1 more |
2017-07-18 |
| 9036416 |
Non-volatile storage with broken word line screen and data recovery |
Nima Mokhlesi, Lanlan Gu, Deepak Raghu |
2015-05-19 |
| 8953398 |
Block level grading for reliability and yield improvement |
Dana Lee, Jianmin Huang, Mrinal Kochar |
2015-02-10 |
