Issued Patents All Time
Showing 1–15 of 15 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12204422 | Multiple plane programming with quick plane programming termination and lagging plane boosting | Lu Tong, Chai Chuan Yao, Ekamdeep Singh, Lakshmi Kalpana Vakati, Sheng-Huang Lee +3 more | 2025-01-21 |
| 11947890 | Implementation of deep neural networks for testing and quality control in the production of memory devices | Cheng-Chung Chu, Janet George, Daniel Linnen | 2024-04-02 |
| 11023327 | Encryption detection and backup management | Daniel Linnen, Avinash Rajagiri, Srikar Peesari | 2021-06-01 |
| 11003551 | Non-volatile storage system with program failure recovery | Daniel Linnen, Khanfer A. Kukkady | 2021-05-11 |
| 10886002 | NAND field use erase plus defect detections | Daniel Linnen, Avinash Rajagiri, Yuvaraj Krishnamoorthy, Srikar Peesari, Dongxiang Liao | 2021-01-05 |
| 10846418 | Location-based authentication and monitoring for data storage devices | Daniel Linnen, Avinash Rajagiri, Srikar Peesari, Dongxiang Liao, Rohit Sehgal | 2020-11-24 |
| 10776277 | Partial memory die with inter-plane re-mapping | Daniel Linnen, Srikar Peesari, Kirubakaran Periyannan, Avinash Rajagiri, Shantanu Gupta +2 more | 2020-09-15 |
| 10564861 | Parity relocation for reducing temperature throttling | Daniel Linnen, Dongxiang Liao, Jagdish Sabde, Avinash Rajagiri, Abhinav Anand | 2020-02-18 |
| 10324859 | Multi-plane memory management | Daniel Linnen, Dongxiang Liao, Srikar Peesari, Avinash Rajagiri, Philip Reusswig +1 more | 2019-06-18 |
| 10290354 | Partial memory die | Daniel Linnen, Srikar Peesari, Kirubakaran Periyannan, Avinash Rajagiri, Shantanu Gupta +4 more | 2019-05-14 |
| 10249382 | Determination of fast to program word lines in non-volatile memory | Dana Lee, Ekam Singh, Kalpana Vakati | 2019-04-02 |
| 9905307 | Leakage current detection in 3D memory | Lakshmi Kalpana Vakati, Ekamdeep Singh, Chang Hua Siau, Gopinath Balakrishnan, Kapil Verma | 2018-02-27 |
| 9711227 | Non-volatile memory with in field failure prediction using leakage detection | Yuvaraj Krishnamoorthy, Ekamdeep Singh, Kalpana Vakati, Maythin Uthayopas, Mark Shlick +1 more | 2017-07-18 |
| 9036416 | Non-volatile storage with broken word line screen and data recovery | Nima Mokhlesi, Lanlan Gu, Deepak Raghu | 2015-05-19 |
| 8953398 | Block level grading for reliability and yield improvement | Dana Lee, Jianmin Huang, Mrinal Kochar | 2015-02-10 |