Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12412771 | Methods of detecting process deviations during microelectronic device fabrication and associated tapes and components | Ankur Shah, Venkateswarlu Bhavanasi, Wen How Sim | 2025-09-09 |
| 10483239 | Semiconductor device including dual pad wire bond interconnection | Junrong Yan, Xiaofeng Di, Gokul Kumar, Chee Keong Chin, Ming Xia Wu +1 more | 2019-11-19 |