ML

Myoung-Soo Lee

Samsung: 9 patents #14,526 of 75,807Top 20%
LG: 8 patents #5,418 of 26,165Top 25%
NO Novera Optics: 1 patents #16 of 26Top 65%
Overall (All Time): #255,510 of 4,157,543Top 7%
18
Patents All Time

Issued Patents All Time

Showing 1–18 of 18 patents

Patent #TitleCo-InventorsDate
10120224 Curved cover for curved display and curved type display apparatus including the same Chang Hoon Song, Min-shik Roh 2018-11-06
9860942 Organic light emitting diode display device Sun Hee LEE 2018-01-02
9817261 Curved cover for curved display and curved type display apparatus including the same Chang Hoon Song, Min-shik Roh 2017-11-14
9583728 Organic light emitting device Tae Kyung Kim, Byoung-Chul Kim 2017-02-28
9252385 Organic light emitting device Tae Kyung Kim, Byoung-Chul Kim 2016-02-02
9169409 Ink composition for imprint lithography and roll printing Sung Hee Kim, Soon-Sung Yoo, Jin Wuk Kim, Byung-Geol Kim, Byung-Uk Kim +4 more 2015-10-27
8936898 Photosensitive resin composition for imprinting process and method for forming organic layer over substrate Yeon Heui Nam, Jin Wuk Kim, Tae-Joon Song, Seong-Pil Cho, Byung-Uk Kim +2 more 2015-01-20
8522172 Method of forming photomask using calibration pattern, and photomask having calibration pattern Young Keun Yoon, Hee-Bom Kim, Chan-uk Jeon, Hak-Seung Han 2013-08-27
8213722 Method for inspecting critical dimension uniformity at high speed measurement Hee-Bom Kim, Young-Su Sung 2012-07-03
8137870 Method of manufacturing photomask Young-Su Sung, Hee-Bom Kim, Min Lee, Dong Gun Lee 2012-03-20
8007963 Photomask Young-Su Sung, Sang-Gyun Woo 2011-08-30
7935552 Ink composition and method of fabricating liquid crystal display device using the same Sung Hee Kim, Soon-Sung Yoo, Jin Wuk Kim, Byung-Geol Kim, Byung-Uk Kim +4 more 2011-05-03
7812929 Electrostatic chuck with temperature sensing unit, exposure equipment having the same, and method of detecting temperature from photomask Chan-uk Jeon 2010-10-12
7763397 Photomask registration errors of which have been corrected and method of correcting registration errors of photomask Suk-Jong Bae, Jung Hoon Lee, Seong-woo Choi, Byung-Gook Kim 2010-07-27
7646472 Off-axis illumination apparatus, exposure apparatus and off-axis illumination method Suk-Jong Bae 2010-01-12
7630079 Equipment and method for measuring transmittance of photomask under off axis illumination Suk-Jong Bae 2009-12-08
7247412 Method of correcting deviations of critical dimensions of patterns formed on a wafer in a EUVL process 2007-07-24
6631224 Tunable filter with core mode blocker Wayne V. Sorin, In-Kag Hwang, Byoung Y. Kim 2003-10-07