Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7486392 | Method of inspecting for defects and apparatus for performing the method | Yu-Sin Yang, Chung-Sam Jun, Tae-Sung Kim, Byung-Sug Lee | 2009-02-03 |
| 7446865 | Method of classifying defects | Chung-Sam Jun, Yu-Sin Yang, Byung-Sug Lee, Ji-Young Shin, Tae-Sung Kim | 2008-11-04 |
| 7385689 | Method and apparatus for inspecting substrate pattern | Kye-Weon Kim, Chung-Sam Jun, Sang-Mun Chon, Seong Jin Kim, Byung-Sug Lee +1 more | 2008-06-10 |