Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7486392 | Method of inspecting for defects and apparatus for performing the method | Yu-Sin Yang, Chung-Sam Jun, Ki-Suk Chung, Tae-Sung Kim | 2009-02-03 |
| 7446865 | Method of classifying defects | Ki-Suk Chung, Chung-Sam Jun, Yu-Sin Yang, Ji-Young Shin, Tae-Sung Kim | 2008-11-04 |
| 7394279 | Method of measuring a surface voltage of an insulating layer | Mi-Sung Lee, Yu-Sin Yang, Chung-Sam Jun | 2008-07-01 |
| 7385689 | Method and apparatus for inspecting substrate pattern | Kye-Weon Kim, Chung-Sam Jun, Ki-Suk Chung, Sang-Mun Chon, Seong Jin Kim +1 more | 2008-06-10 |