Issued Patents All Time
Showing 226–250 of 334 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7501905 | Oscillator circuit, PLL circuit, semiconductor chip, and test apparatus | Kiyotaka Ichiyama | 2009-03-10 |
| 7496137 | Apparatus for measuring jitter and method of measuring jitter | Kiyotaka Ichiyama, Takahiro Yamaguchi, Mani Soma | 2009-02-24 |
| 7480322 | Electrically-pumped (Ga,In,Al)N vertical-cavity surface-emitting laser | Daniel F. Feezell, Daniel A. Cohen, Robert M. Farrell, Shuji Nakamura | 2009-01-20 |
| 7466140 | Signal generation circuit, jitter injection circuit, semiconductor chip and test apparatus | Kiyotaka Ichiyama | 2008-12-16 |
| 7460592 | Apparatus for measuring jitter and method of measuring jitter | Takahiro Yamaguchi, Mani Soma | 2008-12-02 |
| 7412341 | Jitter amplifier, jitter amplification method, electronic device, testing apparatus, and testing method | Kiyotaka Ichiyama, Takahiro Yamaguchi | 2008-08-12 |
| 7409307 | Calibration apparatus, calibration method, testing apparatus, and testing method | — | 2008-08-05 |
| 7398169 | Measuring apparatus, measuring method, testing apparatus, testing method, and electronics device | Takahiro Yamaguchi, Satoshi Iwamoto, Masakatsu Suda | 2008-07-08 |
| 7397847 | Testing device for testing electronic device and testing method thereof | Takahiro Yamaguchi, Mani Soma | 2008-07-08 |
| 7394277 | Testing apparatus, testing method, jitter filtering circuit, and jitter filtering method | Kiyotaka Ichiyama, Takahiro Yamaguchi | 2008-07-01 |
| 7356109 | Apparatus for and method of measuring clock skew | Takahiro Yamaguchi, Mani Soma | 2008-04-08 |
| 7352190 | Calibration apparatus, calibration method, and testing apparatus | — | 2008-04-01 |
| 7345311 | Semiconductor substrate, method of manufacturing the semiconductor substrate, semiconductor device and pattern forming method | Masahiro Ogawa, Masaya Mannoh, Masaaki Yuri | 2008-03-18 |
| 7322390 | Pneumatic tire having tread with blocks having obtuse angle corner portions | Kenji Yamane | 2008-01-29 |
| 7317309 | Wideband signal analyzing apparatus, wideband period jitter analyzing apparatus, and wideband skew analyzing apparatus | Takahiro Yamaguchi, Mani Soma | 2008-01-08 |
| 7313496 | Test apparatus and test method for testing a device under test | Takahiro Yamaguchi, Mani Soma | 2007-12-25 |
| 7305025 | Measurement instrument and measurement method | Takahiro Yamaguchi, Mani Soma | 2007-12-04 |
| 7263150 | Probability estimating apparatus and method for peak-to-peak clock skews | Takahiro Yamaguchi, Mani Soma | 2007-08-28 |
| 7254764 | Generating test patterns used in testing semiconductor integrated circuit | Takahiro Yamaguchi | 2007-08-07 |
| 7229499 | Manufacturing method for semiconductor device, semiconductor device and semiconductor wafer | — | 2007-06-12 |
| 7225377 | Generating test patterns used in testing semiconductor integrated circuit | Takahiro Yamaguchi | 2007-05-29 |
| 7225378 | Generating test patterns used in testing semiconductor integrated circuit | Takahiro Yamaguchi | 2007-05-29 |
| 7203229 | Apparatus for and method of measuring jitter | Takahiro Yamaguchi, Mani Soma | 2007-04-10 |
| 7185254 | Method and apparatus for generating test patterns used in testing semiconductor integrated circuit | Takahiro Yamaguchi | 2007-02-27 |
| 7136773 | Testing apparatus and testing method | Takahiro Yamaguchi, Mani Soma | 2006-11-14 |