Issued Patents All Time
Showing 201–225 of 334 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7917331 | Deterministic component identifying apparatus, identifying, program, recording medium, test system and electronic device | Kiyotaka Ichiyama, Takahiro Yamaguchi | 2011-03-29 |
| 7915633 | Nitride semiconductor device and manufacturing method thereof | — | 2011-03-29 |
| 7903776 | Jitter measurement apparatus, jitter calculator, jitter measurement method, program, recording medium, communication system and test apparatus | Kiyotaka Ichiyama, Takahiro Yamaguchi | 2011-03-08 |
| 7904776 | Jitter injection circuit, pattern generator, test apparatus, and electronic device | Kiyotaka Ichiyama | 2011-03-08 |
| 7834639 | Jitter injection circuit, pattern generator, test apparatus, and electronic device | Kiyotaka Ichiyama | 2010-11-16 |
| 7835479 | Jitter injection apparatus, jitter injection method, testing apparatus, and communication chip | — | 2010-11-16 |
| 7801211 | Communication system, receiver unit, and adaptive equalizer | Kiyotaka Ichiyama | 2010-09-21 |
| 7797121 | Test apparatus, and device for calibration | — | 2010-09-14 |
| 7778785 | Signal-to-noise ratio measurement for discrete waveform | Takahiro Yamaguchi, Masayuki Kawabata, Mani Soma | 2010-08-17 |
| 7778319 | Jitter measuring apparatus, jitter measuring method and test apparatus | Kiyotaka Ichiyama, Yasuhide Kuramochi, Takahiro Yamaguchi | 2010-08-17 |
| 7740614 | Indwelling needle assembly | Takato Murashita, Masaki Fukuda | 2010-06-22 |
| 7724811 | Delay circuit, jitter injection circuit, and test apparatus | Kiyotaka Ichiyama, Takahiro Yamaguchi | 2010-05-25 |
| 7715512 | Jitter measurement apparatus, jitter measurement method, and recording medium | Kiyotaka Ichiyama, Takahiro Yamaguchi | 2010-05-11 |
| 7706723 | Image forming apparatus including phase difference correction with a single drive unit | Kazuki Suzuki, Tetsuji Nishikawa, Yasuhiro Maehata, Takayuki Niihara, Makoto Kikura | 2010-04-27 |
| 7702252 | Connector and image forming apparatus including the same | Yasuhiro Maehata, Kazuki Suzuki, Takayuki Niihara, Makoto Kikura, Tetsuji Nishikawa | 2010-04-20 |
| 7684944 | Calibration apparatus, calibration method, and testing apparatus | Toshiyuki Okayasu | 2010-03-23 |
| 7665004 | Timing generator and semiconductor testing apparatus | Masakatsu Suda, Daisuke Watanabe | 2010-02-16 |
| 7655490 | Manufacturing method for semiconductor device, semiconductor device and semiconductor wafer | — | 2010-02-02 |
| 7638997 | Phase measurement apparatus | — | 2009-12-29 |
| 7636387 | Measuring apparatus and measuring method | Takahiro Yamaguchi, Mani Soma, Hirobumi Musha | 2009-12-22 |
| 7614435 | Pneumatic tire having circumferential straight main groove, arcuate curved main grooves and circumferential auxiliary grooves | — | 2009-11-10 |
| 7596173 | Test apparatus, clock generator and electronic device | Takahiro Yamaguchi, Mani Soma | 2009-09-29 |
| 7564897 | Jitter measuring apparatus, jitter measuring method and PLL circuit | Kiyotaka Ichiyama, Takahiro Yamaguchi, Mani Soma | 2009-07-21 |
| 7554332 | Calibration apparatus, calibration method, testing apparatus, and testing method | Kiyotaka Ichiyama, Takahiro Yamaguchi | 2009-06-30 |
| 7541815 | Electronic device, testing apparatus, and testing method | Kiyotaka Ichiyama, Takahiro Yamaguchi | 2009-06-02 |