Issued Patents All Time
Showing 25 most recent of 37 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7957458 | Jitter measurement apparatus, jitter measurement method, test apparatus and electronic device | Kiyotaka Ichiyama, Masahiro Ishida, Takahiro Yamaguchi | 2011-06-07 |
| 7778785 | Signal-to-noise ratio measurement for discrete waveform | Takahiro Yamaguchi, Masayuki Kawabata, Masahiro Ishida | 2010-08-17 |
| 7636387 | Measuring apparatus and measuring method | Takahiro Yamaguchi, Masahiro Ishida, Hirobumi Musha | 2009-12-22 |
| 7596173 | Test apparatus, clock generator and electronic device | Masahiro Ishida, Takahiro Yamaguchi | 2009-09-29 |
| 7564897 | Jitter measuring apparatus, jitter measuring method and PLL circuit | Kiyotaka Ichiyama, Masahiro Ishida, Takahiro Yamaguchi | 2009-07-21 |
| 7496137 | Apparatus for measuring jitter and method of measuring jitter | Kiyotaka Ichiyama, Masahiro Ishida, Takahiro Yamaguchi | 2009-02-24 |
| 7460592 | Apparatus for measuring jitter and method of measuring jitter | Takahiro Yamaguchi, Masahiro Ishida | 2008-12-02 |
| 7397847 | Testing device for testing electronic device and testing method thereof | Masahiro Ishida, Takahiro Yamaguchi | 2008-07-08 |
| 7356109 | Apparatus for and method of measuring clock skew | Takahiro Yamaguchi, Masahiro Ishida | 2008-04-08 |
| 7340381 | Characterization of radio frequency (RF) signals using wavelet-based parameter extraction | Welela Haileselassie, Jessica Yan | 2008-03-04 |
| 7317309 | Wideband signal analyzing apparatus, wideband period jitter analyzing apparatus, and wideband skew analyzing apparatus | Takahiro Yamaguchi, Masahiro Ishida | 2008-01-08 |
| 7313496 | Test apparatus and test method for testing a device under test | Masahiro Ishida, Takahiro Yamaguchi | 2007-12-25 |
| 7305025 | Measurement instrument and measurement method | Takahiro Yamaguchi, Masahiro Ishida | 2007-12-04 |
| 7263150 | Probability estimating apparatus and method for peak-to-peak clock skews | Masahiro Ishida, Takahiro Yamaguchi | 2007-08-28 |
| 7253443 | Electronic device with integrally formed light emitting device and supporting member | Minako Yoshida, Takahiro Yamaguchi, Masayoshi Ichikawa | 2007-08-07 |
| 7203229 | Apparatus for and method of measuring jitter | Masahiro Ishida, Takahiro Yamaguchi | 2007-04-10 |
| 7193728 | Processing apparatus, processing method and position detecting device | Masayoshi Ichikawa, Takahiro Yamaguchi, Minako Yoshida | 2007-03-20 |
| 7136773 | Testing apparatus and testing method | Masahiro Ishida, Takahiro Yamaguchi | 2006-11-14 |
| 7127018 | Apparatus for and method of measuring clock skew | Takahiro Yamaguchi, Masahiro Ishida | 2006-10-24 |
| 7054358 | Measuring apparatus and measuring method | Takahiro Yamaguchi, Masahiro Ishida, Hirobumi Musha | 2006-05-30 |
| 6990417 | Jitter estimating apparatus and estimating method | Takahiro Yamaguchi, Masahiro Ishida | 2006-01-24 |
| 6922439 | Apparatus for and method of measuring jitter | Takahiro Yamaguchi, Masahiro Ishida | 2005-07-26 |
| 6885700 | Charge-based frequency measurement bist | Seongwon Kim | 2005-04-26 |
| 6795496 | Jitter measuring device and method | Takahiro Yamaguchi, Masahiro Ishida, Yasuo Furukawa, Toshifumi Watanabe | 2004-09-21 |
| 6775321 | Apparatus for and method of measuring a jitter | Masahiro Ishida, Takahiro Yamaguchi, Toshifumi Watanabe | 2004-08-10 |