Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
MS

Mani Soma — 37 Patents

ADAdvantest: 33 patents #9 of 1,193Top 1%
UWUniversity Of Washington: 3 patents #341 of 2,234Top 20%
UNUnknown: 3 patents #7,366 of 83,584Top 9%
Seattle, WA: #503 of 21,776 inventorsTop 3%
Washington: #1,864 of 76,902 inventorsTop 3%
Overall (All Time): #88,321 of 4,157,543Top 3%
37 Patents All Time
Mani Soma has been granted 37 US patents while listed as an inventor at Advantest. The first was granted in 1999 and the most recent in June 2011. Mani Soma ranks #88,321 of 4,157,543 US inventors in our database (top 2.1%). Patent records list Mani Soma in Seattle, WA, US.

Issued Patents All Time

Showing 1–25 of 37 patents

Patent #TitleCo-InventorsDateApprox Value ⓘ
7957458 Jitter measurement apparatus, jitter measurement method, test apparatus and electronic device Kiyotaka Ichiyama, Masahiro Ishida, Takahiro Yamaguchi 2011-06-07 $240,000
7778785 Signal-to-noise ratio measurement for discrete waveform Takahiro Yamaguchi, Masayuki Kawabata, Masahiro Ishida 2010-08-17 $70,000
7636387 Measuring apparatus and measuring method Takahiro Yamaguchi, Masahiro Ishida, Hirobumi Musha 2009-12-22 $169,000
7596173 Test apparatus, clock generator and electronic device Masahiro Ishida, Takahiro Yamaguchi 2009-09-29 $198,000
7564897 Jitter measuring apparatus, jitter measuring method and PLL circuit Kiyotaka Ichiyama, Masahiro Ishida, Takahiro Yamaguchi 2009-07-21 $288,000
7496137 Apparatus for measuring jitter and method of measuring jitter Kiyotaka Ichiyama, Masahiro Ishida, Takahiro Yamaguchi 2009-02-24 $93,000
7460592 Apparatus for measuring jitter and method of measuring jitter Takahiro Yamaguchi, Masahiro Ishida 2008-12-02 $18,000
7397847 Testing device for testing electronic device and testing method thereof Masahiro Ishida, Takahiro Yamaguchi 2008-07-08 $69,000
7356109 Apparatus for and method of measuring clock skew Takahiro Yamaguchi, Masahiro Ishida 2008-04-08 $68,000
7340381 Characterization of radio frequency (RF) signals using wavelet-based parameter extraction Welela Haileselassie, Jessica Yan 2008-03-04
7317309 Wideband signal analyzing apparatus, wideband period jitter analyzing apparatus, and wideband skew analyzing apparatus Takahiro Yamaguchi, Masahiro Ishida 2008-01-08 $106,000
7313496 Test apparatus and test method for testing a device under test Masahiro Ishida, Takahiro Yamaguchi 2007-12-25
7305025 Measurement instrument and measurement method Takahiro Yamaguchi, Masahiro Ishida 2007-12-04 $193,000
7263150 Probability estimating apparatus and method for peak-to-peak clock skews Masahiro Ishida, Takahiro Yamaguchi 2007-08-28 $44,000
7253443 Electronic device with integrally formed light emitting device and supporting member Minako Yoshida, Takahiro Yamaguchi, Masayoshi Ichikawa 2007-08-07 $115,000
7203229 Apparatus for and method of measuring jitter Masahiro Ishida, Takahiro Yamaguchi 2007-04-10 $91,000
7193728 Processing apparatus, processing method and position detecting device Masayoshi Ichikawa, Takahiro Yamaguchi, Minako Yoshida 2007-03-20 $58,000
7136773 Testing apparatus and testing method Masahiro Ishida, Takahiro Yamaguchi 2006-11-14 $21,000
7127018 Apparatus for and method of measuring clock skew Takahiro Yamaguchi, Masahiro Ishida 2006-10-24 $79,000
7054358 Measuring apparatus and measuring method Takahiro Yamaguchi, Masahiro Ishida, Hirobumi Musha 2006-05-30 $178,000
6990417 Jitter estimating apparatus and estimating method Takahiro Yamaguchi, Masahiro Ishida 2006-01-24 $175,000
6922439 Apparatus for and method of measuring jitter Takahiro Yamaguchi, Masahiro Ishida 2005-07-26 $67,000
6885700 Charge-based frequency measurement bist Seongwon Kim 2005-04-26
6795496 Jitter measuring device and method Takahiro Yamaguchi, Masahiro Ishida, Yasuo Furukawa, Toshifumi Watanabe 2004-09-21 $286,000
6775321 Apparatus for and method of measuring a jitter Masahiro Ishida, Takahiro Yamaguchi, Toshifumi Watanabe 2004-08-10 $96,000