Issued Patents All Time
Showing 26–37 of 37 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6737852 | Clock skew measuring apparatus and method | Masahiro Ishida, Takahiro Yamaguchi | 2004-05-18 |
| 6735538 | Apparatus and method for measuring quality measure of phase noise waveform | Takahiro Yamaguchi, Masahiro Ishida | 2004-05-11 |
| 6687629 | Apparatus for and method of measuring a jitter | Takahiro Yamaguchi, Masahiro Ishida, Yasuo Furukawa, Toshifumi Watanabe | 2004-02-03 |
| 6621860 | Apparatus for and method of measuring a jitter | Takahiro Yamaguchi, Masahiro Ishida | 2003-09-16 |
| 6598004 | Jitter measurement apparatus and its method | Masahiro Ishida, Takahiro Yamaguchi | 2003-07-22 |
| 6594595 | Apparatus for and method of measuring cross-correlation coefficient between signals | Takahiro Yamaguchi, Masahiro Ishida | 2003-07-15 |
| 6525523 | Jitter measurement apparatus and its method | Masahiro Ishida, Takahiro Yamaguchi, Toshifumi Watanabe | 2003-02-25 |
| 6460001 | Apparatus for and method of measuring a peak jitter | Takahiro Yamaguchi, Masahiro Ishida | 2002-10-01 |
| 6423558 | Method for fabricating integrated circuit (IC) dies with multi-layered interconnect structures | Yasuhiro Maeda, Masahiro Ishida, Takahiro Yamaguchi | 2002-07-23 |
| 6400129 | Apparatus for and method of detecting a delay fault in a phase-locked loop circuit | Takahiro Yamaguchi, Masahiro Ishida | 2002-06-04 |
| 6291979 | Apparatus for and method of detecting a delay fault | Takahiro Yamaguchi, Masahiro Ishida | 2001-09-18 |
| 5980246 | Orthodontics headgear compliance monitor | Douglas S. Ramsay, Chris Prall, George A. Barrett | 1999-11-09 |