| 9379201 |
Electrostatic discharge diodes and methods of forming electrostatic discharge diodes |
Vidhya Ramachandran, Shiqun Gu, Chiew-Guan Tan, Jung Pill Kim, Taehyun Kim |
2016-06-28 |
| 9190201 |
Magnetic film enhanced inductor |
Xia Li, Matthew Michael Nowak, Seung H. Kang |
2015-11-17 |
| 9184130 |
Electrostatic protection for stacked multi-chip integrated circuits |
Chiew-Guan Tan, Gregory Ameriada Uvieghara, Reza Jalilizeinali |
2015-11-10 |
| 9153461 |
Semiconductor device having stacked memory elements and method of stacking memory elements on a semiconductor device |
Shiqun Gu |
2015-10-06 |
| 9093462 |
Electrostatic discharge diode |
Vidhya Ramachandran, Shiqun Gu, Chiew-Guan Tan, Jung Pill Kim, Taehyun Kim |
2015-07-28 |
| 9041220 |
Semiconductor device having stacked memory elements and method of stacking memory elements on a semiconductor device |
Shiqun Gu |
2015-05-26 |
| 8912043 |
Dual-side interconnected CMOS for stacked integrated circuits |
Arvind Chandrasekaran |
2014-12-16 |
| 8618539 |
Interconnect sensor for detecting delamination |
Shiqun Gu, Homyar C. Mogul, Mark M. Nakamoto, Arvind Chandrasekaran |
2013-12-31 |
| 8604626 |
Reduced susceptibility to electrostatic discharge during 3D semiconductor device bonding and assembly |
Ronnie A. Lindley, Dong Wook Kim, Reza Jalilizeinali, Shiqun Gu, Matthew Michael Nowak |
2013-12-10 |
| 8557680 |
Semiconductor wafer-to-wafer bonding for dissimilar semiconductor dies and/or wafers |
Arvind Chandrasekaran |
2013-10-15 |
| 8536893 |
Circuit for measuring magnitude of electrostatic discharge (ESD) events for semiconductor chip bonding |
Eugene R. Worley |
2013-09-17 |
| 8525342 |
Dual-side interconnected CMOS for stacked integrated circuits |
Arvind Chandrasekaran |
2013-09-03 |
| 8508301 |
Three dimensional inductor, transformer and radio frequency amplifier |
Jonghae Kim, Shiqun Gu, Thomas R. Toms, Lew G. Chua-Eoan, Seyfollah Bazarjani +1 more |
2013-08-13 |
| 8362599 |
Forming radio frequency integrated circuits |
Jonghae Kim, Matthew Michael Nowak, Jiayu Xu |
2013-01-29 |
| 8354300 |
Reducing susceptibility to electrostatic discharge damage during die-to-die bonding for 3-D packaged integrated circuits |
Arvind Chandrasekaran |
2013-01-15 |
| 8350358 |
Techniques for placement of active and passive devices within a chip |
Jonghae Kim, Shiqun Gu, Thomas R. Toms, Matthew Michael Nowak |
2013-01-08 |
| 8324066 |
Techniques for placement of active and passive devices within a chip |
Jonghae Kim, Shiqun Gu, Thomas R. Toms, Matthew Michael Nowak |
2012-12-04 |
| 8319325 |
Intra-die routing using back side redistribution layer and associated method |
Chandra Sekhar Nimmagadda |
2012-11-27 |
| 8242543 |
Semiconductor wafer-to-wafer bonding for dissimilar semiconductor dies and/or wafers |
Arvind Chandrasekaran |
2012-08-14 |
| 8198736 |
Reduced susceptibility to electrostatic discharge during 3D semiconductor device bonding and assembly |
Reza Jalilizeinali, Shiqun Gu |
2012-06-12 |
| 8143952 |
Three dimensional inductor and transformer |
Jonghae Kim, Shiqun Gu, Thomas R. Toms, Lew G. Chua-Eoan, Seyfollah Bazarjani +1 more |
2012-03-27 |
| 8067816 |
Techniques for placement of active and passive devices within a chip |
Jonghae Kim, Shiqun Gu, Thomas R. Toms, Matthew Michael Nowak |
2011-11-29 |
| 4647850 |
Integrated circuit for measuring mask misalignment |
Alan M. Gundlach, Anthony John Walton |
1987-03-03 |