Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9625557 | Work function calibration of a non-contact voltage sensor | Steven R. Soss | 2017-04-18 |
| 7900526 | Defect classification utilizing data from a non-vibrating contact potential difference sensor | Jeffrey Hawthorne, Yeyuan Yang, Mark Schulze | 2011-03-08 |
| 7659734 | Semiconductor inspection system and apparatus utilizing a non-vibrating contact potential difference sensor and controlled illumination | Jeffrey Hawthorne, Yeyuan Yang, Mark Schulze | 2010-02-09 |
| 7634365 | Inspection system and apparatus | Jeffrey Hawthorne | 2009-12-15 |
| 7379826 | Semiconductor wafer inspection system | Jeffrey Hawthorne | 2008-05-27 |
| 7337076 | Inspection system and apparatus | Jeffrey Hawthorne | 2008-02-26 |
| 7308367 | Wafer inspection system | Jeffrey Hawthorne, Chunho Kim, David C. Sowell | 2007-12-11 |
| 7152476 | Measurement of motions of rotating shafts using non-vibrating contact potential difference sensor | Jeffrey Hawthorne | 2006-12-26 |
| 7107158 | Inspection system and apparatus | Jeffrey Hawthorne | 2006-09-12 |
| 7103482 | Inspection system and apparatus | Jeffrey Hawthorne, Chunho Kim, David C. Sowell | 2006-09-05 |
| 7092826 | Semiconductor wafer inspection system | Jeffrey Hawthorne | 2006-08-15 |
| 6957154 | Semiconductor wafer inspection system | Jeffrey Hawthorne | 2005-10-18 |