Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7308367 | Wafer inspection system | M. Brandon Steele, Jeffrey Hawthorne, Chunho Kim | 2007-12-11 |
| 7103482 | Inspection system and apparatus | M. Brandon Steele, Jeffrey Hawthorne, Chunho Kim | 2006-09-05 |
| 5533107 | Method for routing calls based on predetermined assignments of callers geographic locations | Janine M. Irwin, James M. Seymour, Iris Y. Chen, James M. Davis, Nailesh B. Desai +1 more | 1996-07-02 |