| 8275564 |
Patterned wafer inspection system using a non-vibrating contact potential difference sensor |
Jun Liu, Jeffrey Hawthorne |
2012-09-25 |
| 8244461 |
Navigational display for parachutists |
Michael G. Durrett, Keith D. Jamison, Daniel S. Shedd |
2012-08-14 |
| 7900526 |
Defect classification utilizing data from a non-vibrating contact potential difference sensor |
Jeffrey Hawthorne, M. Brandon Steele, Yeyuan Yang |
2011-03-08 |
| 7752000 |
Calibration of non-vibrating contact potential difference measurements to detect surface variations that are perpendicular to the direction of sensor motion |
William R. Usry |
2010-07-06 |
| 7742979 |
System and method for automated commodities transactions including an automatic hedging function |
Gary Reding, Kent Beadle, Chris Nikkel, Walker Humphries, Dave Womeldorf +4 more |
2010-06-22 |
| 7659734 |
Semiconductor inspection system and apparatus utilizing a non-vibrating contact potential difference sensor and controlled illumination |
Jeffrey Hawthorne, M. Brandon Steele, Yeyuan Yang |
2010-02-09 |
| 7418423 |
System and method for automated commodities transactions including an automatic hedging function |
Gary Reding, Kent Beadle, Chris Nikkel, Walker Humphries, Dave Womeldorf +4 more |
2008-08-26 |