Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7900526 | Defect classification utilizing data from a non-vibrating contact potential difference sensor | Jeffrey Hawthorne, M. Brandon Steele, Mark Schulze | 2011-03-08 |
| 7659734 | Semiconductor inspection system and apparatus utilizing a non-vibrating contact potential difference sensor and controlled illumination | Jeffrey Hawthorne, M. Brandon Steele, Mark Schulze | 2010-02-09 |