Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11460577 | Distance measuring device | — | 2022-10-04 |
| 11027364 | Method and device for measuring the depth of the vapor capillary during a machining process with a high-energy beam | Martin Schönleber | 2021-06-08 |
| 10762348 | Method and apparatus for determining the position and/or the orientation of an eye | Gabriel Palzer, Stefan Birmanns | 2020-09-01 |
| 10725178 | Optical measuring device | — | 2020-07-28 |
| 10695863 | Method and device for the controlled machining of a workpiece | — | 2020-06-30 |
| 10466357 | Optical measuring device | — | 2019-11-05 |
| 10228551 | Device and method for optically measuring a measurement object | Martin Schönleber, Jean-Francois Pichot | 2019-03-12 |
| 9230817 | Apparatus and method for monitoring a thickness of a silicon wafer with a highly doped layer | Martin Schoenleber | 2016-01-05 |
| 8716039 | Monitoring apparatus and method for in-situ measurement of wafer thicknesses for monitoring the thinning of semiconductor wafers and thinning apparatus comprising a wet etching apparatus and a monitoring apparatus | Claus Dusemund, Martin Schoenleber, Berthold Michelt | 2014-05-06 |
| 8699038 | Apparatus and method for monitoring a thickness of a silicon wafer with a highly doped layer | Martin Schoenleber | 2014-04-15 |
| 8410392 | Machining device and method for machining material | Markus Kogel-Hollacher | 2013-04-02 |
| 6084223 | Method of welding workpieces and apparatus for carrying it out | Markus Koegel-Hollacher | 2000-07-04 |