Issued Patents All Time
Showing 76–95 of 95 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9721937 | Integrated circuit containing first and second does of standard cell compatible, NCEM-enabled fill cells, with the first DOE including side-to-side short configured fill cells, and the second DOE including tip-to-tip short configured fill cells | Stephen Lam, Dennis Ciplickas, Tomasz Brozek, Jeremy Cheng, Simone Comensoli +20 more | 2017-08-01 |
| 9711496 | Integrated circuit containing first and second DOEs of standard cell compatible, NCEM-enabled fill cells, with the first DOE including side-to-side short configured fill cells, and the second DOE including tip-to-side short configured fill cells | Stephen Lam, Dennis Ciplickas, Tomasz Brozek, Jeremy Cheng, Simone Comensoli +20 more | 2017-07-18 |
| 9711421 | Process for making semiconductor dies, chips, and wafers using in-line measurements obtained from DOEs of GATE-snake-open-configured, NCEM-enabled fill cells | Stephen Lam, Dennis Ciplickas, Tomasz Brozek, Jeremy Cheng, Simone Comensoli +20 more | 2017-07-18 |
| 9691672 | Integrated circuit containing standard logic cells and library-compatible, NCEM-enabled fill cells, including at least via-open-configured, GATE-short-configured, GATECNT-short-configured, and metal-short-configured, NCEM-enabled fill cells | Stephen Lam, Dennis Ciplickas, Tomasz Brozek, Jeremy Cheng, Simone Comensoli +20 more | 2017-06-27 |
| 9653446 | Integrated circuit containing standard logic cells and library-compatible, NCEM-enabled fill cells, including at least via-open-configured, AACNT-short-configured, TS-short-configured, and AA-short-configured, NCEM-enabled fill cells | Stephen Lam, Dennis Ciplickas, Tomasz Brozek, Jeremy Cheng, Simone Comensoli +20 more | 2017-05-16 |
| 9646961 | Integrated circuit containing standard logic cells and library-compatible, NCEM-enabled fill cells, including at least via-open-configured, AACNT-short-configured, TS-short-configured, and metal-short-configured, NCEM-enabled fill cells | Stephen Lam, Dennis Ciplickas, Tomasz Brozek, Jeremy Cheng, Simone Comensoli +20 more | 2017-05-09 |
| 9627371 | Integrated circuit containing standard logic cells and library-compatible, NCEM-enabled fill cells, including at least via-open-configured, GATE-short-configured, GATECNT-short-configured, and AA-short-configured, NCEM-enabled fill cells | Stephen Lam, Dennis Ciplickas, Tomasz Brozek, Jeremy Cheng, Simone Comensoli +20 more | 2017-04-18 |
| 9627370 | Integrated circuit containing standard logic cells and library-compatible, NCEM-enabled fill cells, including at least via-open-configured, GATE-short-configured, GATECNT-short-configured, and TS-short-configured, NCEM-enabled fill cells | Stephen Lam, Dennis Ciplickas, Tomasz Brozek, Jeremy Cheng, Simone Comensoli +20 more | 2017-04-18 |
| 7673262 | System and method for product yield prediction | Brian E. Stine, Christopher Hess, John Kibarian, Kimon Michaels, Joseph C. Davis +4 more | 2010-03-02 |
| 7527987 | Fast localization of electrical failures on an integrated circuit system and method | Dennis Ciplickas, Christopher Hess, Sherry Lee | 2009-05-05 |
| 7373625 | System and method for product yield prediction | Brian E. Stine, Christopher Hess, John Kibarian, Kimon Michaels, Joseph C. Davis +4 more | 2008-05-13 |
| 7356800 | System and method for product yield prediction | Brian E. Stine, Christopher Hess, John Kibarian, Kimon Michaels, Joseph C. Davis +4 more | 2008-04-08 |
| 7197726 | Test structures for estimating dishing and erosion effects in copper damascene technology | Dennis Ciplickas, Markus Decker, Christopher Hess, Brian E. Stine | 2007-03-27 |
| 7174521 | System and method for product yield prediction | Brian E. Stine, Christopher Hess, John Kibarian, Kimon Michaels, Joseph C. Davis +4 more | 2007-02-06 |
| 7154115 | Zoom in pin nest structure, test vehicle having the structure, and method of fabricating the structure | Brian E. Stine, Christopher Hess, Dennis Ciplickas | 2006-12-26 |
| 7024642 | Extraction method of defect density and size distributions | Christopher Hess, David Stashower, Brian E. Stine, Richard Burch, Dennis Ciplickas | 2006-04-04 |
| 6901564 | System and method for product yield prediction | Brian E. Stine, Christopher Hess, John Kibarian, Kimon Michaels, Joseph C. Davis +4 more | 2005-05-31 |
| 6834375 | System and method for product yield prediction using a logic characterization vehicle | Brian E. Stine, Christopher Hess, Dennis Ciplickas, John Kibarian | 2004-12-21 |
| 6787800 | Test vehicle with zig-zag structures | Christopher Hess | 2004-09-07 |
| 6475871 | Passive multiplexor test structure for integrated circuit manufacturing | Brian E. Stine, Christopher Hess | 2002-11-05 |