Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Charged-particle-beam device, specimen-image acquisition method, and program recording medium

Charged-particle-beam device, specimen-image acquisition method, and program recording medium

US Patent 9741530 · Granted Aug 22, 2017

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Tweezers, conveyance device, and method for conveying sample piece2025
Charged particle microscope device and wide-field image generation method2022
Environmental resistant coating member2021
Observation support unit for charged particle microscope and sample observation 2019
Touch sensor substrate, touch panel, display device, and method for producing to2019
Charged particle beam device, sample observation method, sample platform, observ2019
Image processing device, image processing method and image processing system2019
Scanning electron microscope2019
Electron scanning microscope and image generation method2018
Electron scanning microscope and image generation method2018
Method for adjusting height of sample and observation system2018
Electron scanning microscope and image generation method2018