Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Static random access memory test structure

Static random access memory test structure

US Patent 8787074 · Granted Jul 22, 2014

Estimated economic value: $5,473,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Addressable test chip2023
High impedance cell detection2023
Addressable test system with address register2022
Epitaxial structures of semiconductor devices that are independent of local patt2021
Conditional forced perspective in spherical video2020
Apparatus for and method of net trace prior level subtraction2020
Self-aligned single diffusion break for fully depleted silicon-on-insulator and 2020
System and method for processing digital video2019
System and method for processing digital video2019
Addressable test chip test system2019
Diffusion break forming after source/drain forming and related IC structure2018
Etch stop liner for contact punch through mitigation in SOI substrate2018