Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Test yield estimate for semiconductor products created from a library

Test yield estimate for semiconductor products created from a library

US Patent 8010916 · Granted Aug 30, 2011

Estimated economic value: $4,619,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Partial computer processor core shutoff2022
Hardware apparatus to measure memory locality2020
Product performance test binning2020
Optimizing integrated circuit designs based on interactions between multiple int2020
Optimizing integrated circuit designs based on interactions between multiple int2020
Pre-test power-optimized bin reassignment following selective voltage binning2019
Methodology to prevent metal lines from current pulse damage2019
Integrated circuit design layout optimizer based on process variation and failur2018
Product performance test binning2018
Performance matching in three-dimensional (3D) integrated circuit (IC) using bac2018
Burn-in power performance optimization2018
Timing/power risk optimized selective voltage binning using non-linear voltage s2018