Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Integrated circuit testing methods using well bias modification

Integrated circuit testing methods using well bias modification

US Patent 7759960 · Granted Jul 20, 2010

Estimated economic value: $3,139,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Image dispositioning using machine learning2024
User privacy for autonomous vehicles2024
Action-object recognition in cluttered video scenes using text2024
Constructing, evaluating, and improving a search string for retrieving images in2023
Compliant organic substrate assembly for rigid probes2023
Object dataset creation or modification using labeled action-object videos2022
Diagnostic enhancement for multiple instances of identical structures2022
Interconnect and tuning thereof2022
Action-object recognition in cluttered video scenes using text2022
Secure credit card with near field communications2022
Method for proactive trouble-shooting of provisioning workflows for efficient cl2022
Automating table-based groundtruth generation2021