{"@context": "https://schema.org", "@type": "BreadcrumbList", "itemListElement": [{"@type": "ListItem", "position": 1, "name": "Home", "item": "https://www.patentleaderboard.com/"}, {"@type": "ListItem", "position": 2, "name": "Defect detection using time delay lock-in thermography (LIT) and dark field LIT", "item": "https://www.patentleaderboard.com/patent/7709794"}]}
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Defect detection using time delay lock-in thermography (LIT) and dark field LIT

US Patent 7709794 · Granted May 4, 2010

Estimated economic value: $5,126,000 ⓘ

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