Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Test apparatus having multiple test sites at one handler and its test method

Test apparatus having multiple test sites at one handler and its test method

US Patent 7378864 · Granted May 27, 2008

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Memory core characteristic screening method and system thereof2025
Memory interface circuitry and built-in self-testing method2024
Semiconductor package test apparatus and method2024
Display apparatus2018
Display apparatus2016
Handoff system and method between different kinds of devices, SIP server and ope2011
Real-time optimized testing of semiconductor device2010
Real-time optimized testing of semiconductor device2010
Semiconductor device including fuse focus detector, fabricating method thereof a2010
Method of testing semiconductor devices and handler used for testing semiconduct2009
Method of testing semiconductor devices and handler used for testing semiconduct2009
Test apparatus having multiple head boards at one handler and its test method2009