Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method and apparatus for fast automated failure classification for semiconductor wafers

Method and apparatus for fast automated failure classification for semiconductor wafers

US Patent 6963813 · Granted Nov 8, 2005

Assignee

No assignee recorded.

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Method of monitoring a semiconductor manufacturing trend2009
Method of monitoring a semiconductor manufacturing trend2009
Method of monitoring a semiconductor manufacturing trend2009
Reducing memory failures in integrated circuits2007
Method of and system for analyzing cells of a memory device2006
Method of and system for analyzing cells of a memory device2006
Method of and system for analyzing cells of a memory device2006
Memory cell signal window testing apparatus2006
Sensing of memory integrated circuits2005
Sensing test circuit2005
Redundancy in series grouped memory architecture2005
2T2C signal margin test mode using a defined charge and discharge of BL and /BL2004