Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7003432 | Method of and system for analyzing cells of a memory device | Joerg Wohlfahrt, Jens Holzhaeuser, Dieter Rathei | 2006-02-21 |
| 6963813 | Method and apparatus for fast automated failure classification for semiconductor wafers | Dieter Rathei, Peter Oswald, Joerg Wohlfahrt | 2005-11-08 |
| 6564346 | Advanced bit fail map compression with fail signature analysis | Joerg Vollrath, Ulf Lederer, Peter Oswald, Zschunke Andreas, Rausch Harold | 2003-05-13 |
| 6493645 | Method for detecting and classifying scratches occurring during wafer semiconductor processing | — | 2002-12-10 |