Issued Patents All Time
Showing 1–25 of 32 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9251871 | Sense amplifier with dual gate precharge and decode transistors | Richard Ferrant, Roland Thewes, Wolfgang Hoenlein, Hofmann Franz, Gerhard Enders | 2016-02-02 |
| 7719868 | Integrated semiconductor memory | — | 2010-05-18 |
| 7626870 | Semiconductor device with a plurality of one time programmable elements | — | 2009-12-01 |
| 7402859 | Field effect semiconductor switch and method for fabricating it | Marcin Gnat, Ralf Schneider, Stephan Schroeder | 2008-07-22 |
| 7376026 | Integrated semiconductor memory having sense amplifiers selectively activated at different timing | Marcin Gnat | 2008-05-20 |
| 7372095 | Integrated semiconductor circuit comprising a transistor and a strip conductor | — | 2008-05-13 |
| 7365554 | Integrated circuit for determining a voltage | Marcin Gnat, Aurel von Campenhausen, Ralf Schneider | 2008-04-29 |
| 7313741 | Integrated semiconductor memory | Marcin Gnat, Aurel von Campenhausen, Frank Schroeppel | 2007-12-25 |
| 7224627 | Integrated semiconductor circuit and method for testing the same | Marcin Gnat, Aurel von Campenhausen, Ralf Schneider | 2007-05-29 |
| 7203883 | Integrated circuit | Aurel von Campenhausen, Marcin Gnat, Ralf Schneider | 2007-04-10 |
| 7196537 | Integrated circuit | Aurel von Campenhausen, Ralf Schneider, Marcin Gnat | 2007-03-27 |
| 7068546 | Integrated memory having a voltage generator circuit for generating a voltage supply for a read/write amplifier | Ralf Schneider, Marcin Gnat | 2006-06-27 |
| 7051253 | Pseudo fail bit map generation for RAMS during component test and burn-in in a manufacturing environment | Randall J. Rooney | 2006-05-23 |
| 7023276 | Differential amplifier circuit | Marcin Gnat, Ullrich Menczigar | 2006-04-04 |
| 6998664 | Integrated semiconductor circuit having a cell array having a multiplicity of memory cells | Stephan Schröder, Tobias Hartner | 2006-02-14 |
| 6981175 | Memory and method for employing a checksum for addresses of replaced storage elements | Philip Moore | 2005-12-27 |
| 6967370 | Integrated semiconductor circuit having a multiplicity of memory cells | Stephan Schröder, Tobias Hartner | 2005-11-22 |
| 6956404 | Driver circuit having a plurality of drivers for driving signals in parallel | Ralf Schneider, Marcin Gnat | 2005-10-18 |
| 6927557 | Voltage generator arrangement | Manfred Proll, Stephan Schröder, Ralf Schneider | 2005-08-09 |
| 6900626 | Voltage generator arrangement | Manfred Proll, Ralf Schneider, Stephan Schröder | 2005-05-31 |
| 6853214 | Circuit configuration for controlling load-dependent driver strengths | Stephan Schröder | 2005-02-08 |
| 6816094 | Circuit configuration for the bit-parallel outputting of a data word | Stephan Schröder | 2004-11-09 |
| 6737671 | Current measurement circuit and method for voltage regulated semiconductor integrated circuit devices | Philip Moore, Ulrich Zimmermann | 2004-05-18 |
| 6696349 | STI leakage reduction | Robert Petter | 2004-02-24 |
| 6564346 | Advanced bit fail map compression with fail signature analysis | Ulf Lederer, Peter Oswald, Thomas Hladschik, Zschunke Andreas, Rausch Harold | 2003-05-13 |