Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7587292 | Method of monitoring a semiconductor manufacturing trend | — | 2009-09-08 |
| 7524683 | Method of monitoring a semiconductor manufacturing trend | — | 2009-04-28 |
| 7496478 | Method of monitoring a semiconductor manufacturing trend | — | 2009-02-24 |
| 7003432 | Method of and system for analyzing cells of a memory device | Joerg Wohlfahrt, Thomas Hladschik, Jens Holzhaeuser | 2006-02-21 |
| 6963813 | Method and apparatus for fast automated failure classification for semiconductor wafers | Peter Oswald, Thomas Hladschik, Joerg Wohlfahrt | 2005-11-08 |
| 6717431 | Method for semiconductor yield loss calculation | Joerg Wohlfahrt, Luis G. Andrade, Robert Petter, Thomas Steven Taylor, Babatunde Ashiru +3 more | 2004-04-06 |
| 6553521 | Method for efficient analysis semiconductor failures | Thomas Giegold, Joerg Wohlfahrt | 2003-04-22 |
| 6367040 | System and method for determining yield impact for semiconductor devices | Reinhold Ott, Herbert Lammering | 2002-04-02 |