Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Systems and methods for facilitating automated test equipment functionality within integrated circuits

Systems and methods for facilitating automated test equipment functionality within integrated circuits

US Patent 6741946 · Granted May 25, 2004

Estimated economic value: $5,451,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Devices, systems, and methods for detecting and mitigating silent data corruptio2025
Devices, systems, and methods for detecting and mitigating silent data corruptio2024
Breakout structure for an integrated circuit device2023
System and method for providing compliant mapping between chip bond locations an2012
Determination of filter weights2010
Method and apparatus for an embedded time domain reflectometry test2009
Apparatus and method for compensating clock period elongation during scan testin2009
Method and apparatus for enabling a user to determine whether a defective locati2009
Circuit and method for comparing circuit performance between functional and AC s2009
Circuit and method for comparing circuit performance between functional and AC s2009
Systems and methods for reconfiguring scan chains2009
Testing target resistances in circuit assemblies2008