| 7516379 |
Circuit and method for comparing circuit performance between functional and AC scan testing in an integrated circuit (IC) |
Jeffrey R. Rearick |
2009-04-07 |
| 7139955 |
Hierarchically-controlled automatic test pattern generation |
Jeff Rearick |
2006-11-21 |
| 7043674 |
Systems and methods for facilitating testing of pads of integrated circuits |
Jeffrey R. Rearick, Shad Shepston |
2006-05-09 |
| 6986085 |
Systems and methods for facilitating testing of pad drivers of integrated circuits |
Jeffrey R. Rearick, Shad Shepston |
2006-01-10 |
| 6944837 |
System and method for evaluating an integrated circuit design |
Jeff Rearick, Christopher M. Juenemann |
2005-09-13 |
| 6907376 |
Systems and methods for facilitating testing of pad receivers of integrated circuits |
Shad Shepston, Jeffrey R. Rearick |
2005-06-14 |
| 6895562 |
Partitioning integrated circuit hierarchy |
Jeff Rearick, Daryl Allred |
2005-05-17 |
| 6865706 |
Apparatus and method for generating a set of test vectors using nonrandom filling |
Jeff Rearick |
2005-03-08 |
| 6859059 |
Systems and methods for testing receiver terminations in integrated circuits |
Jeffrey R. Rearick |
2005-02-22 |
| 6762614 |
Systems and methods for facilitating driver strength testing of integrated circuits |
Jeffrey R. Rearick, Shad Shepston |
2004-07-13 |
| 6741946 |
Systems and methods for facilitating automated test equipment functionality within integrated circuits |
Jeffrey R. Rearick, Shad Shepston |
2004-05-25 |
| 6721920 |
Systems and methods for facilitating testing of pad drivers of integrated circuits |
Jeff Rearick, Shad Shepston |
2004-04-13 |
| 6707313 |
Systems and methods for testing integrated circuits |
Jeff Rearick |
2004-03-16 |
| 6658613 |
Systems and methods for facilitating testing of pad receivers of integrated circuits |
Jeffrey R. Rearick, Shad Shepston |
2003-12-02 |
| 6577980 |
Systems and methods for facilitating testing of pad receivers of integrated circuits |
Shad Shepston, Jeffrey R. Rearick |
2003-06-10 |
| 6556938 |
Systems and methods for facilitating automated test equipment functionality within integrated circuits |
Jeffrey R. Rearick, Shad Shepston |
2003-04-29 |
| 6396312 |
Gate transition counter |
Shad Shepston, Jeff Rearick |
2002-05-28 |
| 6234689 |
Apparatus and method for mapping a custom routine to an interface button |
Thomas H. Baker, Michael J. Bennett, Mercedes Gil, Robert W. Proulx |
2001-05-22 |
| 6067651 |
Test pattern generator having improved test sequence compaction |
Jeffrey R. Rearick |
2000-05-23 |
| 5905986 |
Highly compressible representation of test pattern data |
Jeff Rearick |
1999-05-18 |
| 5495578 |
Apparatus and method for changing the behavior of a computer program while retaining control of program execution |
Thomas H. Baker, Michael J. Bennett, Mercedes Gil, Robert W. Proulx |
1996-02-27 |
| 5400263 |
Apparatus and method for specifying the flow of test execution and the binning for a testing system |
Thomas H. Baker, Michael J. Bennett, Mercedes Gil, Robert W. Proulx |
1995-03-21 |
| 5390131 |
Apparatus and method for displaying wafer test results in real time |
Thomas H. Baker, Michael J. Bennett, Mercedes Gil, Robert W. Proulx |
1995-02-14 |
| 5381344 |
Apparatus and method for obtaining a list of numbers of wafers for integrated circuit testing |
Thomas H. Baker, Michael J. Bennett, Mercedes P. Gil, Robert W. Proulx |
1995-01-10 |