SS

Shad Shepston

AT Agilent Technologies: 13 patents #110 of 3,411Top 4%
HP HP: 4 patents #4,446 of 16,619Top 30%
AM AMD: 1 patents #5,683 of 9,279Top 65%
Overall (All Time): #235,080 of 4,157,543Top 6%
19
Patents All Time

Issued Patents All Time

Showing 1–19 of 19 patents

Patent #TitleCo-InventorsDate
11812544 Breakout structure for an integrated circuit device Robert A. Daniels 2023-11-07
8181125 System and method for providing compliant mapping between chip bond locations and package bond locations for an integrated circuit Jason Harold Culler 2012-05-15
7746924 Determination of filter weights Karl J. Bois, Dacheng Zhou, David Quint 2010-06-29
7411440 System located in an integrated circuit for reducing calibration components Yong Wang, Jason Harold Culler 2008-08-12
7043674 Systems and methods for facilitating testing of pads of integrated circuits Jeffrey R. Rearick, John G. Rohrbaugh 2006-05-09
6986085 Systems and methods for facilitating testing of pad drivers of integrated circuits Jeffrey R. Rearick, John G. Rohrbaugh 2006-01-10
6907376 Systems and methods for facilitating testing of pad receivers of integrated circuits Jeffrey R. Rearick, John G. Rohrbaugh 2005-06-14
6762614 Systems and methods for facilitating driver strength testing of integrated circuits Jeffrey R. Rearick, John G. Rohrbaugh 2004-07-13
6741946 Systems and methods for facilitating automated test equipment functionality within integrated circuits John G. Rohrbaugh, Jeffrey R. Rearick 2004-05-25
6721920 Systems and methods for facilitating testing of pad drivers of integrated circuits Jeff Rearick, John G. Rohrbaugh 2004-04-13
6658613 Systems and methods for facilitating testing of pad receivers of integrated circuits Jeffrey R. Rearick, John G. Rohrbaugh 2003-12-02
6577980 Systems and methods for facilitating testing of pad receivers of integrated circuits Jeffrey R. Rearick, John G. Rohrbaugh 2003-06-10
6570930 Three-state differential data transmission with self latching ability 2003-05-27
6556938 Systems and methods for facilitating automated test equipment functionality within integrated circuits John G. Rohrbaugh, Jeffrey R. Rearick 2003-04-29
6469558 Electrically adjustable pulse delay circuit M. Jason Welch 2002-10-22
6396312 Gate transition counter Jeff Rearick, John G. Rohrbaugh 2002-05-28
6281687 Off-chip process, voltage, temperature, compensation resistor sharing 2001-08-28
6181185 Low mismatch complementary clock generator 2001-01-30
6094089 Current limiting receiver with impedance/load matching for a powered down receiver chip 2000-07-25