Issued Patents All Time
Showing 1–15 of 15 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8810532 | In-situ detection of touchscreen panel shorts | Sarangan Narasimhan | 2014-08-19 |
| 8648834 | Controller and ADC for low power operation of touchscreen device | Jerome D. Wong, Zhi Zhong Huang, Xu Zhang, Xiao Yan Zheng | 2014-02-11 |
| 7315542 | Handling and discarding packets in a switching subnetwork | S. Paul Tucker, Edmundo Rojas | 2008-01-01 |
| 7313090 | Systems and methods for providing data packet flow control | Edmundo Rojas, S. Paul Tucker | 2007-12-25 |
| 7209476 | Method and apparatus for input/output port mirroring for networking system bring-up and debug | Ian G. Colloff, Norman C. Chou, Richard L. Schober, Edmundo Rojas, Zhang Xiaoyang | 2007-04-24 |
| 7191259 | Method and apparatus for fast integer within-range compare | — | 2007-03-13 |
| 7149221 | Apparatus and methods for increasing bandwidth in an infiniband switch | — | 2006-12-12 |
| 7054330 | Mask-based round robin arbitration | Norman C. Chou, Yolin Lih | 2006-05-30 |
| 6922749 | Apparatus and methodology for an input port of a switch that supports cut-through operation within the switch | Richard L. Schober, Ian G. Colloff | 2005-07-26 |
| 6904507 | Buffer management architecture and method for an infiniband subnetwork | — | 2005-06-07 |
| 6763418 | Request bus arbitration | Norman C. Chou, Yolin Lih | 2004-07-13 |
| 6234689 | Apparatus and method for mapping a custom routine to an interface button | John G. Rohrbaugh, Thomas H. Baker, Michael J. Bennett, Robert W. Proulx | 2001-05-22 |
| 5495578 | Apparatus and method for changing the behavior of a computer program while retaining control of program execution | John G. Rohrbaugh, Thomas H. Baker, Michael J. Bennett, Robert W. Proulx | 1996-02-27 |
| 5400263 | Apparatus and method for specifying the flow of test execution and the binning for a testing system | John G. Rohrbaugh, Thomas H. Baker, Michael J. Bennett, Robert W. Proulx | 1995-03-21 |
| 5390131 | Apparatus and method for displaying wafer test results in real time | John G. Rohrbaugh, Thomas H. Baker, Michael J. Bennett, Robert W. Proulx | 1995-02-14 |