Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Detecting defects in integrated circuits

Detecting defects in integrated circuits

US Patent 6043662 · Granted Mar 28, 2000

Assignee

No assignee recorded.

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Systems and methods for broadcasting audio2024
Systems and methods for broadcasting audio2022
Assisting conversation in noisy environments2015
Breaking up long-channel field effect transistor into smaller segments for relia2014
Using entire area of chip in TDDB checking2014
Mitigation of detrimental breakdown of a high dielectric constant metal-insulato2014
Selective capping of copper2012
Semiconductor device and process for reducing damaging breakdown in gate dielect2012
Semiconductor device and process for reducing damaging breakdown in gate dielect2012
Nanoparticle cap layer2011
Protection of Cu damascene interconnects by formation of a self-aligned buffer l2011
Nanoparticle cap layer2011