Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Configuration measuring method and apparatus for optically detecting a displacement of a probe due to an atomic force

Configuration measuring method and apparatus for optically detecting a displacement of a probe due to an atomic force

US Patent 5616916 · Granted Apr 1, 1997

Estimated economic value: $38,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Measurement probe2022
Measurement probe2022
Long-acting adrenomedullin derivatives2022
Shape measuring apparatus2015
Semiconductor device and a method of manufacturing the same2012
Shape measuring apparatus and shape measuring method2011
Shape measuring apparatus and shape measuring method2011
Shape measurement device probe and shape measurement device2010
Semiconductor device and a method of manufacturing the same2010
Semiconductor device with MISFET that includes embedded insulating film arranged2009
Three-dimensional measurement probe2009
Three-dimensional measurement probe2009