Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Gap measuring device and method using frustrated internal reflection

Gap measuring device and method using frustrated internal reflection

US Patent 5225690 · Granted Jul 6, 1993

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Polymer gel having sponge-like porous structure2025
Process for producing low-concentration gel using gel-precursor clusters, and ge2020
Breaking apparatus and breaking method for substrate made of brittle material2014
Processing method for a workpiece, dividing method for a workpiece, and laser pr2013
Apparatus for supporting substrate, apparatus for measuring surface potential, a2011
Substrate treatment method and substrate treatment apparatus2009
Optical disk device2009
Substrate processing apparatus2009
Substrate processing apparatus2008
Substrate processing apparatus2007
Land pre-pit address demodulating device2007
Substrate processing apparatus comprising ring-shaped motor2006