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Home › Integrated circuit testing system having a cantilevered contact lead probe pattern mounted on a flexible tape for interconnecting an integrated circuit to a tester

Integrated circuit testing system having a cantilevered contact lead probe pattern mounted on a flexible tape for interconnecting an integrated circuit to a tester

US Patent 5189363 · Granted Feb 23, 1993

Estimated economic value: $13,775,000 ⓘ

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