Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Gate stack quality for gate-all-around field-effect transistors

Gate stack quality for gate-all-around field-effect transistors

US Patent 12408431 · Granted Sep 2, 2025

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Dielectric tuning of negative capacitance in dual channel field effect transisto2025
Solid-state switch2025
Gate induced drain leakage reduction in FinFETs2025
Metal hard mask integration for active device structures2025
Redundant bottom pad and sacrificial via contact for process induced RRAM formin2025
Top contact on resistive random access memory2025
Wraparound contact with reduced distance to channel2025
In-situ chip design for pulse IV self-heating evaluation2025
Vertical transport field effect transistors having different threshold voltages 2025
Vertical transport field effect transistors having different threshold voltages 2025
Vertical transport field effect transistors having different threshold voltages 2025
Process-induced forming of oxide RRAM2025