Wafer-level test method for optoelectronic chips

Assignee

• Jenoptik Gmbh

Inventors

• Tobias Gnausch (6 patents)
• Armin Grundmann (5 patents)
• Thomas Kaden (7 patents)
• Norik Janunts (2 patents)
• Robert BUETTNER (4 patents)
• Christian KARRAS (3 patents)

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