Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11906579 | Wafer-level test method for optoelectronic chips | Tobias Gnausch, Armin Grundmann, Thomas Kaden, Robert BUETTNER, Christian KARRAS | 2024-02-20 |
| 11162976 | Assembly for detecting the intensity distribution of components of the electromagnetic field in beams of radiation | — | 2021-11-02 |