Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12210057 | Wafer-level test method for optoelectronic chips | Tobias Gnausch, Robert BUETTNER, Kay Reetz, Armin Grundmann, Thomas Kaden | 2025-01-28 |
| 12203983 | Contacting module for contacting optoelectronic chips | Robert BUETTNER, Armin Grundmann, Tobias Gnausch, Thomas Kaden, Stefan Franz | 2025-01-21 |
| 11906579 | Wafer-level test method for optoelectronic chips | Tobias Gnausch, Armin Grundmann, Thomas Kaden, Norik Janunts, Robert BUETTNER | 2024-02-20 |