Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12210057 | Wafer-level test method for optoelectronic chips | Christian KARRAS, Tobias Gnausch, Robert BUETTNER, Armin Grundmann, Thomas Kaden | 2025-01-28 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12210057 | Wafer-level test method for optoelectronic chips | Christian KARRAS, Tobias Gnausch, Robert BUETTNER, Armin Grundmann, Thomas Kaden | 2025-01-28 |