Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12210057 | Wafer-level test method for optoelectronic chips | Christian KARRAS, Tobias Gnausch, Kay Reetz, Armin Grundmann, Thomas Kaden | 2025-01-28 |
| 12203983 | Contacting module for contacting optoelectronic chips | Armin Grundmann, Tobias Gnausch, Thomas Kaden, Stefan Franz, Christian KARRAS | 2025-01-21 |
| 11906579 | Wafer-level test method for optoelectronic chips | Tobias Gnausch, Armin Grundmann, Thomas Kaden, Norik Janunts, Christian KARRAS | 2024-02-20 |
| 11480495 | Position-tolerance-insensitive contacting module for contacting optoelectronic chips | Tobias Gnausch, Thomas Kaden, Thomas Juhasz, Armin Grundmann, Thilo von Freyhold | 2022-10-25 |