Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Adjusting scan connections based on scan control locations

Adjusting scan connections based on scan control locations

US Patent 10216885 · Granted Feb 26, 2019

Estimated economic value: $2,499,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Operating pulsed latches on a variable power supply2021
Operating pulsed latches on a variable power supply2021
Characterizing and simulating library gates to enable identification and elimina2021
Integrated circuit design changes using through-silicon vias2021
Dynamically power noise adaptive automatic test pattern generation2020
Logic built in self test circuitry for use in an integrated circuit with scan ch2020
Logic built in self test circuitry for use in an integrated circuit with scan ch2020
Optimizing error correcting code in three-dimensional stacked memory2020
Power management for memory subsystems2020
Priority based circuit synthesis2020
Determining clock signal quality using a plurality of sensors2020
Logic built in self test circuitry for use in an integrated circuit with scan ch2020