Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Defect detection and classification based on attributes determined from a standard reference image

Defect detection and classification based on attributes determined from a standard reference image

US Patent 10127652 · Granted Nov 13, 2018

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Print check repeater defect detection2025
Crawling welding robot2024
Crawling welding robot and method of controlling the same2023
Print check repeater defect detection2022
Wafer inspection using difference images2022
Method and system for correlating optical images with scanning electron microsco2022
Repeater defect detection2021
System, method and non-transitory computer readable medium for tuning sensitivit2021
High accuracy of relative defect locations for repeater analysis2021
Detecting defects in a logic region on a wafer2021
Previous layer nuisance reduction through oblique illumination2020
Method and apparatus for generating heatmap2020