Issued Patents All Time
Showing 26–36 of 36 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6222400 | Lock-in detecting circuit having variable window for checking phase locked loop and method used therein | Takafumi Esaki, Yoshiyuki Uto, Hiroshi Furukawa | 2001-04-24 |
| 5850094 | Semiconductor device | Katsuhiro Kato | 1998-12-15 |
| 5781389 | Transistor protection circuit | Shinnichi Fukuzako | 1998-07-14 |
| 5646449 | Semiconductor device having a multi-layered conductive structure which includes an aluminum alloy layer, a high melting temperature metal layer, and a high melting temperature nitride layer | Makiko Nakamura, Yasuyuki Tatara, Yusuke Harada, Hiroshi Onoda | 1997-07-08 |
| 5608594 | Semiconductor integrated circuit with surge-protected output MISFET's | — | 1997-03-04 |
| 5432369 | Input/output protection circuit | Yoshiaki Katakura | 1995-07-11 |
| 5288948 | Structure of a semiconductor chip having a conductive layer | Tetsuhiko Sugahara, Norio Hirashita, Mitsuhiro Matsuo, Minoru Saito, Masayuki Kobayakawa +1 more | 1994-02-22 |
| 4987464 | Encapsulated FET semiconductor device with large W/L ratio | Shooji Kitazawa | 1991-01-22 |
| 4924280 | Semiconductor fet with long channel length | Shooji Kitazawa | 1990-05-08 |
| 4823088 | Method of and apparatus for testing semiconductor device for electrostatic discharge damage | — | 1989-04-18 |
| 4636724 | Method and apparatus for examining electrostatic discharge damage to semiconductor devices | Ikuo Suganuma | 1987-01-13 |